Deposition Rates in Thermal Laser Epitaxy: Simulation and Experiment

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📝 Original Info

  • Title: Deposition Rates in Thermal Laser Epitaxy: Simulation and Experiment
  • ArXiv ID: 2501.01859
  • Date: 2025-01-03
  • Authors: 정보 없음 (제공되지 않음)

📝 Abstract

The modeling of deposition rates in Thermal Laser Epitaxy (TLE) is essential for the accurate prediction of the evaporation process and for improved dynamic process control. We demonstrate excellent agreement between experimental data and a model based on a finite element simulation that describes the temperature distribution of an elemental source when irradiated with continuous wave laser radiation. The simulation strongly depends on the thermophysical constants of the material, data of which is lacking for many elements. Effective values for the parameters may be determined with precision by means of an unambiguous reference provided by the melting point of the material, which is directly observed during the experiments. TLE may therefore be used to study the high temperature thermophysical and optical properties of the elements.

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Ta-heatingtime.png Ta-meltpoolcomparisan.png Ta-sensitivityofsim.png Ta-temporal.png Ta_parameters.png Ta_parameters2.png chamber_v2.png convergence-Ta-3mm.png elements-simulation-comp_v.png emiss_absorb_comparisan.png opticaldepth.png parameterspace-Ta.png parameterspacevariation_Ta.png powervsGR_fit-Ta-sim.png powervsGR_fit-comp.png sensitivityofsim_withresiduals.png test.jpg

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