Title: Model Based Ceramic tile inspection using Discrete Wavelet Transform and Euclidean Distance
ArXiv ID: 1003.1811
Date: 2010-03-10
Authors: Researchers from original ArXiv paper
📝 Abstract
Visual inspection of industrial products is used to determine the control quality for these products. This paper deals with the problem of visual inspection of ceramic tiles industry using Wavelet Transform. The third level the coefficients of two dimensions Haar Discrete Wavelet Transform (HDWT) is used in this paper to process the images and feature extraction. The proposed algorithm consists of two main phases. The first phase is to compute the wavelet transform for an image free of defects which known as reference image, and the image to be inspected which known as test image. The second phase is used to decide whether the tested image is defected or not using the Euclidean distance similarity measure. The experimentation results of the proposed algorithm give 97% for correct detection of ceramic defects.
💡 Deep Analysis
Deep Dive into Model Based Ceramic tile inspection using Discrete Wavelet Transform and Euclidean Distance.
Visual inspection of industrial products is used to determine the control quality for these products. This paper deals with the problem of visual inspection of ceramic tiles industry using Wavelet Transform. The third level the coefficients of two dimensions Haar Discrete Wavelet Transform (HDWT) is used in this paper to process the images and feature extraction. The proposed algorithm consists of two main phases. The first phase is to compute the wavelet transform for an image free of defects which known as reference image, and the image to be inspected which known as test image. The second phase is used to decide whether the tested image is defected or not using the Euclidean distance similarity measure. The experimentation results of the proposed algorithm give 97% for correct detection of ceramic defects.
📄 Full Content
(IJCSIS) International Journal of Computer Science and Information Security,
Vol. 7, No. 2, 2010
Model Based Ceramic tile inspection using Discrete
Wavelet Transform and Euclidean Distance
Samir Elmougy1, Ibrahim El-Henawy2, and Ahmed El-Azab3
1Dept. of Computer Science, College of Computer and Information Sciences, King Saud Univ., Riyadh
11543, Saudi Arabia
1Dept. of Computer Science, Faculty of Computer and Information Sciences, Zagazig University, Zagazig,
Egypt
3Dept. of Computer Science, Misr for Engineering and Technology (MET) Academy, Mansoura, Egypt
Abstract— Visual inspection of industrial products is used to
determine the control quality for these products. This paper deals
with the problem of visual inspection of ceramic tiles industry
using Wavelet Transform. The third level the coefficients of two
dimensions Haar Discrete Wavelet Transform (HDWT) is used in
this paper to process the images and feature extraction. The
proposed algorithm consists of two main phases. The first phase
is to compute the wavelet transform for an image free of defects
which known as reference image, and the image to be inspected
which known as test image. The second phase is used to decide
whether the tested image is defected or not using the Euclidean
distance similarity measure. The experimentation results of the
proposed algorithm give 97% for correct detection of ceramic
defects.
Keywords- Visual inspection; DWT; Euclidean distance.
I.
INTRODUCTION
Visual inspection of industrial product is one of
the main important phases in many industries. It is used to
determine the quality for the control for some products such as
wood [1], textile [2], leather [3], steel [4], Printed Circuit
Board (PCB) [5] and ceramic tiles [6]. In realty, ceramic tiles
industry has hazardous, high polluted and unhealthy
environment [7]. The inspection in this industry was usually
made by humans so it is important to use mechanical
technology to instead of standard humans to keep them
healthy. A large variety of fast and different algorithms for
object detection and recognition has been studied during the
last decade by the computer vision community [8]. These
algorithms can be divided into main approaches such as
statistical, structured, filter based and model based [9]. In this
work, a model based approach using DWT and Euclidean
distance is introduced.
The earliest based model for visual inspection of
ceramic tiles was carried by image difference operation (pixel-
by-pixel comparison like XOR logic operator) [5]. Although
this model has a good recognition, its operation costs too
much processing time, and requires much memory more over
the alignment of the tested image which should be identical to
the reference image. Figure (1) depicts the image difference
operation on ceramic tile.
In this paper, the proposed model is based on
discrete wavelet transform because wavelet transform usually
lead to a better image modeling, a better image encoding (this
is the reason why wavelet is used as one of the best
compression methodologies), and a better texture modeling.
Figure 1. Image difference operation of ceramic tile.
XOR
Reference
Test Image
Defects
252
http://sites.google.com/site/ijcsis/
ISSN 1947-5500
(IJCSIS) International Journal of Computer Science and Information Security, Vol. 7, No. 2, 2010
The rest of the paper is organized as follows. Overview of
Wavelet processing is given in Section 2 followed by the
Continuous Wavelet Transform (CWT), 1-D Discrete Wavelet
Transform
and
2-D
Discrete
Wavelet
Transform
in
Subsections 2.1, 2.2 and 2.3 respectively. The proposed
algorithm and its results are shown in Section 3. LVQ neural
network structure and its algorithm explained in Section 4.
Finally, conclusion and future work are discussed in Section 5.
II.
WAVELET PROCESSING
Because the frequency contents of signals are very
important, transforms are usually used. The earliest well
known transform is Fourier transform which is a mathematical
technique for transforming our view of the signal from time
domain to frequency domain. Fourier transform breaks down
the signal constituents into sinusoids of different frequencies.
However, Fourier transform comes with serious shortage that
is the lost of time information which mean it is impossible to
tell when a particular event take place [10]. This shortage
vanishes with using wavelet transform. A shifted version of
the original signal is called mother wavelet which it is a wave
form effectively a limited duration and its average value is
zero. The most well known wavelets are Haar. Figure (2)
depicts some types of these wavelets [11]. A. Continuous Wavelet Transform
The Continuous Wavelet Transform (CWT) given in
Equation (1), where x(t) is the signal to be analyzed, and ψ(t)
is the mother wavelet or the basis function which it must be
integrated to zero as give