
๋ ธ์ด์ฆ๊ฐ ๋ง์ ์์ ์๋ฎฌ๋ ์ด์ ์ ์ํ ๋ก๊ทธํ๋ฅ ๊ธฐ๋ฐ ํตํฉ ์์ ๋ถ๋ฅ ๋ฐ ๊ฒฐํจ ์ ๋ํ ๋ชจ๋ธ
Atomistic simulations generate large volumes of noisy structural data, but extracting phase labels, order parameters (OPs), and defect information in a way that is universal, robust, and interpretable remains challenging. Existing tools such as PTM a
















































